東京理科大学 先進工学部 マテリアル創成工学科 小林研究室

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TOKYO UNIVERSITY OF SCIENCE

KOBAYASHI LAB

Sputtering for Materials Innovation

About us

本研究室では、結晶成長によるマテリアルデザインを通じて、薄膜材料の機能融合に関する研究をおこなっています。 具体的には、半導体、超伝導体、強誘電体などの異種機能材料をナノスケールにまで薄膜化し互いに接合させることで、未来デバイス材料を創出することを目指しています。 特に、量子コンピュータ、量子情報通信、パワーエレクトロニクス、AI計算用新型半導体などの開発に繋がる薄膜材料の高品質化と高機能化に取り組んでいます。

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Publication

Effect of growth temperature on the structural and electrical properties of sputter-epitaxial ScAlN on AlGaN/AlN/GaN heterostructures

S. Ota, T. Okuda, K. Kubota, Y. Wakamoto, T. Maeda, T. Kawahara, K. Makiyama, K. Nakata, A. Kobayashi
APL Materials 13, 081112 (2025).
DOI: 10.1063/5.0281540

Sputter epitaxy of ScAlN films on GaN high electron mobility transistor structures

T. Okuda, S. Ota, T. Kawahara, K. Makiyama, K. Nakata, T. Maeda, A. Kobayashi
Applied Physics Letters 126, 052105 (2025).
DOI: 10.1063/5.0228924

Sputter Epitaxy of Transition Metal Nitrides: Advances in Superconductors, Semiconductors, and Ferroelectrics

A. Kobayashi, T. Maeda, T. Akiyama, T. Kawamura, Y. Honda
Physica Status Solidi A , 2400896 (2025).
DOI: 10.1002/pssa.202400896

Structural characterization of epitaxial ScAlN films grown on GaN by low-temperature sputtering

A. Kobayashi, Y. Honda, T. Maeda, T. Okuda, K. Ueno, H. Fujioka
Applied Physics Express 17, 011002 (2024).
DOI: 10.35848/1882-0786/ad120b

Structural and optical properties of epitaxial ScxAl1-xN coherently grown on GaN bulk substrates by sputtering method

T. Maeda, Y. Wakamoto, S. Kaneki, H. Fujikura, A. Kobayashi
Applied Physics Letters 125, 022103 (2024).
DOI: 10.1063/5.0213662

Hole Conduction Mechanism in In–Mg-Codoped GaN Prepared via Pulsed Sputtering Deposition

A. Naito, K. Ueno, A. Kobayashi, H. Fujioka
Physica Status Solidi A, 2300848 (2024).
DOI: 10.1002/pssa.202300806

Temperature‐Dependent Characteristics of AlN/Al0.5Ga0.5N High Electron Mobility Transistors with Highly Degenerate n‐Type GaN Regrown Ohmic Contacts

R. Maeda, K. Ueno, A. Kobayashi, H. Fujioka
Physica Status Solidi A, 2300848 (2024).
DOI: 10.1002/pssa.202300848

Preparation of degenerate n-type AlxGa1-xN (0 < x ≤ 0.81) with record low resistivity by pulsed sputtering deposition

Y. Nishikawa, K. Ueno, A. Kobayashi, H. Fujioka
Applied Physics Letters 122, 232102 (2023).
DOI: 10.1063/5.0144418

Positive impurity size effect in degenerate Sn-doped GaN prepared by pulsed sputtering

Y. Nishikawa, K. Ueno, A. Kobayashi, H. Fujioka
Applied Physics Letters 122, 082102 (2023).
DOI: 10.1063/5.0118126

Electrical properties of N-polar Si-doped GaN prepared by pulsed sputtering

K. Ueno, Y. Masuda, A. Kobayashi, H. Fujioka
Applied Physics Express 16, 011002 (2023).
DOI: 10.35848/1882-0786/acb2b1

Epitaxial Junction of Inversion Symmetry Breaking AlN and Centrosymmetric NbN: A Polarity Control of Wide-Bandgap AlN

A. Kobayashi, S. Kihira, T. Akiyama, T. Kawamura, T. Maeda, K. Ueno, H. Fujioka
ACS Applied Electronic Materials 5, 240 (2023).
DOI: 10.1021/acsaelm.2c01288

研究業績