論文誌
テキスト形式論文リスト（ギリシャ文字は手で修正してください．）
| Author |
Title |
Journal |
Page |
Year/Month |
PDF |
| 滝田 颯人, 松浦 達治, 岸田 亮, 兵庫 明 |
Correlated Level Shifting技術による離散時間二次ΔΣA/D変換器のSQNR改善と高調波歪の抑制 |
電気学会論文誌Ｃ（電子・情報・システム部門誌） |
141巻, 12号, pp. 1313-1320 |
2021/12 |
pdf |
| S. Sekine, T. Matsuura, R. Kishida, and A. Hyogo |
Digital Calibration Algorithm of Conversion Error Influenced by Parasitic Capacitance in C-C SAR-ADC Based on γ-Estimation |
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences |
vol. E104-A, no. 2,pp. 516-524 |
2021/02 |
pdf |
| T. Hosaka, S. Nishizawa, R. Kishida, T. Matsumoto, and K. Kobayashi |
Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement |
IPSJ Transactions on System LSI Design Methodology |
vol.13, pp. 56-64 |
2020/08 |
pdf |
| R. Kishida, T. Asuke, J. Furuta, and K. Kobayashi |
Extracting Voltage Dependence of BTI-induced Degradation without Temporal Factors by Using BTI-Sensitive and BTI-Insensitive Ring Oscillators |
IEEE Transactions on Semiconductor Manufacturing |
vol. 33, no. 2, pp. 174-179 |
2020/05 |
pdf |
| 関根 慧, 松浦 達治, 岸田 亮, 兵庫 明 |
整数容量比を用いたC-2C D/A変換器の設計手法 |
電気学会論文誌Ｃ（電子・情報・システム部門誌） |
140巻, 2号, pp. 194-203 |
2020/02 |
pdf |
| R. Kishida, J. Furuta, and K. Kobayashi |
Evaluation of plasma-induced damage and bias temperature instability depending on type of antenna layer using current-starved ring oscillators |
Japanese Journal of Applied Physics (JJAP) |
vol. 57, no. 4S, pp. 04FD12-1-5 |
2018/03 |
pdf |
| T. Komawaki, M. Yabuuchi, R. Kishida, J. Furuta, T. Matsumoto, and K. Kobayashi |
Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS Model |
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences |
vol. E-100A, no. 12, pp. 2758-2763 |
2017/12 |
pdf |
| R. Kishida, A. Oshima, M. Yabuuchi, and K. Kobayashi |
Initial and long-term frequency degradation of ring oscillators caused by plasma-induced damage in 65 nm bulk and fully depleted silicon-on-insulator processes |
Japanese Journal of Applied Physics (JJAP) |
vol. 54, no. 4S, pp. 04DC19-1-5 |
2015/03 |
pdf |
| M. Yabuuchi, R. Kishida, and K. Kobayashi |
Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs |
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences |
vol. E97-A, no. 12, pp. 2367-2372 |
2014/12 |
pdf |